Electronics & Optical

Use Clemex Captiva to capture high definition images from your microscope. Perform wafer defect analysis, count fiber optic wedges automatically and measure the shape of foam insulators using Clemex Vision PE or Clemex Vision Lite. Contact us with details of your analysis. 

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  • Best Product Choice

  • Clemex Vision PE

    The most complete image analysis solution

    The exceptional range of digital functions makes this one of the most powerful multipurpose image analysis systems available. It is a fully integrated system... learn more

  • Clemex Vision Lite

    The perfect partner for single applications

    Clemex Vision Lite is ideally suited to repetitive image analysis applications which can be easily analyzed with our optional Application Modules. Together... learn more

  • Clemex Captiva

    Scientific image capturing and measuring

    Intelligent entry-level software for capturing, quantifying and sharing images.
    For labs seeking a robust out of the box solution for simple... learn more

  • Image Analysis Reports

  • Concentricity of foam insulator

    Concentricity of inner diameter compared to outer diameter of foam

    Sample: Foam insulator covering electric wire (inside wire is removed for contrast)

  • Fiber optic

    Count number of fiber optic wedges

    Sample: Fiber optic wedges

  • Wafer defects

    Etch pit count, area, worst field

    Sample: Etched wafer showing crystal defects (etch pits)

  • Chip plating analysis

    Detect vertically aligned plating lines and perform width measurements

    Sample: Chip with vertical plating patterns

  • Quality Standards