Clemex CIR

Reliable inclusion rating solution

Multi-field mapping of entire sample

Locates and maps inclusions of the entire sample area, aligned vertically or horizontally. Worst fields are identified rapidly and artifacts can be removed. Operators switch from one sample to the other with ease. The blue rectangles represent microscope fields, while colored squares are worst field frames.

Auto-detection of sample edges

Automatically finds the physical edge of each sample to create stage patterns that cover the required surface area. For mounted samples, when the steel sample is not exactly the same size or in the same position each time.

Unique shading corrector feature

Ensures even illumination for all images, for an accurate classifi cation of inclusions and artifacts.

Multi-field map view


Features Overview

Enhanced Image Capture

Accurate Object Detection

Detect and Classify

The key to successfully detecting Oxydes and Sulfides is accurate thresholding. Clemex CIR allows you to adjust the image’s thresholding so as to eliminate fine artifacts and scratches.

Intelligent Sample Map

The Sample Map feature stores the coordinates of each analyzed object in multiple-field environments. Operators can navigate between different samples and validate inclusions, whether few or hundreds have been detected.

Different Heats in Same Run

Samples can either be processed one at a time or grouped in any combination of heats/samples with up to 6 heats of 6 samples per run.

Multi-Plate Samples

In multi-plate samples, the thin dark separations between plates are automatically excluded from actual inclusions.

Traceable Objects

The location of all inclusions and artifacts is registered on the interactive sample map, which allows the user to move the stage to the selected field with a simple click of the mouse. Artifacts can be eliminated from a particular field.

Worst Field Rating

ASTM, ISO or DIN worst fields are identified automatically. Solid lines show heavy inclusions, whilst dotted lines represent thin inclusions. Worst fields are displayed visually on the sample map using colors that correspond to inclusion types.

Automation Features

Save Images

During an analysis, users have the option of saving all the images locally for archiving or reprocessing on the same instrument or a remote workstation.

Inclusions That Cross Fields

Inclusions that run across more than one field are taken in consideration during the analysis, regardless of their size or position relative to microscope field edges.

Different Types of Inclusions

Ratings based on international standards. Classify different types of inclusions: Sulfides (A), Aluminates (B), Silicates (C), Globulars (D), Single Globulars (DS), Borides, Carbides, Nitrides   (XxCN).

Professional Looking Reports

Reports are automatically generated according to supported standards. Raw data can be exported in MS Excel or Text files. 

Auto-Create Pattern

Clemex CIR finds the sample edges to automatically create a scanning pattern of 160 or 200 square mm or the total sample area.

User Experience Features

User Defined Stage Patterns

With its user-friendly interface, Clemex CIR allows you to create custom stage patterns in a matter of seconds.

Save and Reload Stage Patterns

The last stage pattern is automatically loaded at startup. This feature is extremely useful for users who analyze the same defined areas repeatedly. If a special pattern is defined for a particular area, it can be saved and retrieved any time.

Existing Microscopes

Clemex CIR is compatible with almost any microscope on the market. Your existing microscope can be converted by adding the Clemex Microscope Stage Controller. Contact us to see if we can upgrade your existing system.

Mounted and Unmounted Samples

High throughput laboratories, such as in steel mills, usually require analyzing unmounted samples in order to save sample preparation time. Clemex CIR analyzes both mounted and unmounted samples.